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Nanotechnology is a popular topic in materials science. Nanoparticles are used for various purposes in all kinds of products, ranging from sunblocker to lipgloss, from anti-contamination coatings on glass to catalysts with specific electronic properties. Its interdisciplinary character involves expertise in for example physics, chemistry, biology and medicine.
Nanosized dimensions
The common factor in nanotechnology is the lateral dimension, being in the nanometer (1 billionth of a meter) range, of the structures studied. Atomic or molecular distances, sizes of structures in semiconductor devices and grain sizes in nanopowders are just a few examples out of many that can be considered as nanosized dimensions.
X-ray diffraction for nanotechnology
In nanotechnology, knowledge of the structure and composition of the materials studied is a key requirement for understanding materials properties over small distances. Since the dimensions of X-ray wavelengths are in the same order of magnitude as the sizes of nanostructures, X-ray diffraction is an ideal tool for the nanoscientist.
An X-ray diffraction instrument should not be missing in a modern laboratory for research on nano- and advanced materials.
PANalytical delivers a number of dedicated solutions for nanostructural problems. Highly perfect structures can be measured using the X'Pert PRO MRD diffractometer with high-resolution optics. For polycrystalline nanomaterials, the X'Pert PRO MPD diffraction system will demonstrate its applicability for e.g. phase identification, nanoparticle size distribution analysis or pair distribution function analysis.
PANalytical offers the following solutions for the analysis of nanomaterials:
- EasySAXS
A key question in nanomaterials research and development is the average size and size distribution of the particles and pores. Small Angle X-ray Scattering (SAXS) is the unique tool for answering this question: results can be obtained within a very short time frame and minimal sample preparation. With PANalytical’s EasySAXS application, this technique, previously only accessible for experts, has been made available for general laboratory use.
- X’Pert HighScore Plus
Average crystallite size, phase composition of nanomaterials and the ratio between amorphous and crystalline components are parameters that can be determined from X-ray diffractograms using X’Pert HighScore Plus, PANalytical’s software package for phase identification, crystallography and Rietveld analysis.
- Pair distribution function (PDF) analysis
For the structural characterization of nanocrystalline materials special techniques are required. Conventional methods used on crystalline materials do not offer a solution, because, by their very nature, nanostructured materials are not periodically long-range ordered. Pair distribution function analysis is a suitable technique, which is now accessible on X’Pert PRO MPD diffractometers.
- X’Pert Reflectivity
Film thickness and uniformity are important parameters for nanometer-sized thin films. X’Pert Reflectivity offers powerful options to analyze X-ray reflectometry data to characterize single and multi-layer structures of, amongst many others, semiconducting and optical materials.
