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X-ray analysis for Building Materials (Cement)
PANalytical has a strong focus on the analysis needs of the global Building Materials industry. This is demonstrated by our dedicated XPERT Solution. Analysis that can be used for the various stages in the manufacturing process of cement, one of the most important and most widely used products in this industry.
Process control with X-ray analysis
X-ray analysis methods are ideal for routine, automatic operations; because they are safe, non-destructive, and require little sample preparation.
X-ray fluorescence (XRF) and X-ray diffraction (XRD) are key techniques for characterizing the element and crystalline phase composition of material. Recently, the X-ray analysis of the polycrystalline phases in powder samples has advanced from its roots in laboratory research to process and quality control, and is now regarded as one of the most powerful process-control tools for building materials.
PANalytical X-ray solutions
PANalytical offers analysis solutions for XRF (element analysis) and for XRD (phase analysis), and the possibility to merge both techniques into one solution.
The CubiX XRF simultaneous spectrometer is the perfect routine spectrometer for routine XRF analysis of the key elements Na, Mg, Al, Si, S, K, Ca, Fe and sometimes Cl in the cement industry. The sequential Axios-Cement XRF spectrometer has built-in flexibility for more demanding applications (for example low Na and K concentrations), or when using alternative fuels and raw materials, which require other compounds to be monitored. A MiniPal spectrometer can be used to monitor the four major elements and as additional tool or back up system to further optimize the plant operation.
The CubiX FAST system is the industrial diffractometer for routine XRD analysis. Its rugged mechanics and electronics allow it to cope with heat, dust and vibration. The integration of the X'Celerator RTMS detector, performing full high quality scans in minutes, has opened the doors to process control for XRD. Previously difficult quantification problems can now be tackled by the referenced Rietveld method, using the fully automated X'Pert RoboRiet software instead of through cumbersome, traditional calibration-based models.
The PANalytical TWIN solution combines XRF and XRD systems for simultaneous analysis. The Supervisor software fully controls the organisation of measurements and analyses to give you the best of both XRF and XRD worlds.
