Pharmaceuticals

Characterization of pharmaceutical compounds and the analysis of complex modern formulations, together with an increasing need for data to support regulatory submissions, means that the pharmaceutical industry now depends on a range of analysis technologies.


Both X-ray powder diffraction (XRPD) and X-ray fluorescence (XRF) spectroscopy are recognized as valuable techniques in many areas of drug discovery, development and manufacture.


X-ray powder diffraction

By non-destructively determining the crystallographic constitution of samples, XRPD is used to:

  • determine crystal structures
  • screen for polymorphs or hydrates
  • detect changes in morphology or crystalline state of active ingredients (e.g. during processing or at non-ambient conditions)
  • detect and quantify crystalline impurities (in some cases down to 0.05%)
  • determine the crystallinity or the crystallite size of a compound
  • analyze and optimize final dosage forms


XRPD data on a compound or drug is also required for new product registration and patent application/protection.


X-ray fluorescence

XRF spectroscopy is a non-destructive technique, which requires simple or even no sample preparation.


It detects and quantifies major and minor elements in fillers, lubricants, coatings and other excipients down to sub-ppm levels. XRF can also be applied to the high precision quantification of catalyst residues present in active ingredients or final drug products.


PANalytical solutions

PANalytical has a range of systems for X-ray analysis within the pharmaceutical industry. All are designed to meet regulatory requirements, including suitability for use in a 21 CFR Part 11 compliant laboratory environment.


X'Pert PRO MPD:
X-ray powder diffractometer that offers the ideal platform for demanding analysis. PreFIX, a unique approach with pre-aligned interchangeable optics and stages, makes the system flexible and future proof. The groundbreaking X'Celerator detector provides ultra-fast data collection with superior resolution.


Axios:
high-end wavelength-dispersive XRF (WDXRF) spectrometer with sophisticated counting electronics, the fastest and most accurate goniometer, unmatched sensitivity and a powerful software package.


Epsilon 5:
high-end energy-dispersive XRF (EDXRF) spectrometer, incorporating patented technologies, that out-performs its rivals in sub-ppm determinations such as the analysis of catalyst residues.


MiniPal 4:
benchtop EDXRF instrument with a new silicon drift detector that delivers the highest resolution in its sector. Ideal for quantifying the major elements in fillers, lubricants, coatings and other excipients.

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